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DE-.8MM-U/J-1.4-.225 - 

TAPERED CROWN TIP WITH A SPHERICAL RADIUS BOTTOM SEMICONDUCTOR PROBE

Smiths Interconnect Americas, Inc. DE-.8MM-U/J-1.4-.225
声明：图片仅供参考，请以实物为准！
制造商产品编号：
DE-.8MM-U/J-1.4-.225
仓库库存编号：
70009134
技术数据表：
View DE-.8MM-U/J-1.4-.225 Datasheet Datasheet
订购热线： 400-900-3095  0755-21000796, QQ:800152669, Email:sales@szcwdz.com
由于产品数据库庞大，部分产品信息可能未能及时更新，下单前请与销售人员确认好实时在库数量，谢谢合作！

DE-.8MM-U/J-1.4-.225产品概述

Semiconductor Probe, 3 A Current, 0.026 in. Pitch
  • 0.187 in. signal path length
  • U tip, both ends
    1.1 Oz. force per contact.

    • DE-.8MM-U/J-1.4-.225产品信息

      Bandwidth  2.4 GHz @ -1 dB  
      Brand/Series  100938 Series  
      Capacitance  0.10 pF  
      Centerline, Spacing  0.026 (0.65) In.(mm) In.(mm)  
      Contact Resistance  70 Milliohms (Max.) Milliohms (Max.)  
      Current Rating  3 A A  
      Force, Spring  1.1 Oz. Oz.  
      Gender  Probe  
      Impedance  50 Ohms  
      Inductance  0.9 nH (Self) @ 0.029 in. Pitch  
      Length, Overall  0.225 In. In.  
      Material, Barrel  Nickel/Silver  
      Material, Plating  Gold Plated (Plunger)  
      Material, Plunger  Beryllium Copper  
      Material, Spring  Stainless Steel  
      Minimum Centers  0.026 In.  
      Primary Type  Probe  
      Temperature, Operating  -55 to +150 °C  
      Tip Style  Crown Headless/Spherical  
      Type  Semiconductor  
    关键词         

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    DE-.8MM-U/J-1.4-.225相关搜索

    Bandwidth 2.4 GHz @ -1 dB  Smiths Interconnect Americas, Inc. Bandwidth 2.4 GHz @ -1 dB  Spring Test Probes Bandwidth 2.4 GHz @ -1 dB  Smiths Interconnect Americas, Inc. Spring Test Probes Bandwidth 2.4 GHz @ -1 dB   Brand/Series 100938 Series  Smiths Interconnect Americas, Inc. Brand/Series 100938 Series  Spring Test Probes Brand/Series 100938 Series  Smiths Interconnect Americas, Inc. Spring Test Probes Brand/Series 100938 Series   Capacitance 0.10 pF  Smiths Interconnect Americas, Inc. Capacitance 0.10 pF  Spring Test Probes Capacitance 0.10 pF  Smiths Interconnect Americas, Inc. Spring Test Probes Capacitance 0.10 pF   Centerline, Spacing 0.026 (0.65) In.(mm) In.(mm)  Smiths Interconnect Americas, Inc. Centerline, Spacing 0.026 (0.65) In.(mm) In.(mm)  Spring Test Probes Centerline, Spacing 0.026 (0.65) In.(mm) In.(mm)  Smiths Interconnect Americas, Inc. Spring Test Probes Centerline, Spacing 0.026 (0.65) In.(mm) In.(mm)   Contact Resistance 70 Milliohms (Max.) Milliohms (Max.)  Smiths Interconnect Americas, Inc. Contact Resistance 70 Milliohms (Max.) Milliohms (Max.)  Spring Test Probes Contact Resistance 70 Milliohms (Max.) Milliohms (Max.)  Smiths Interconnect Americas, Inc. Spring Test Probes Contact Resistance 70 Milliohms (Max.) Milliohms (Max.)   Current Rating 3 A A  Smiths Interconnect Americas, Inc. Current Rating 3 A A  Spring Test Probes Current Rating 3 A A  Smiths Interconnect Americas, Inc. Spring Test Probes Current Rating 3 A A   Force, Spring 1.1 Oz. Oz.  Smiths Interconnect Americas, Inc. Force, Spring 1.1 Oz. Oz.  Spring Test Probes Force, Spring 1.1 Oz. Oz.  Smiths Interconnect Americas, Inc. Spring Test Probes Force, Spring 1.1 Oz. Oz.   Gender Probe  Smiths Interconnect Americas, Inc. Gender Probe  Spring Test Probes Gender Probe  Smiths Interconnect Americas, Inc. Spring Test Probes Gender Probe   Impedance 50 Ohms  Smiths Interconnect Americas, Inc. Impedance 50 Ohms  Spring Test Probes Impedance 50 Ohms  Smiths Interconnect Americas, Inc. Spring Test Probes Impedance 50 Ohms   Inductance 0.9 nH (Self) @ 0.029 in. Pitch  Smiths Interconnect Americas, Inc. Inductance 0.9 nH (Self) @ 0.029 in. Pitch  Spring Test Probes Inductance 0.9 nH (Self) @ 0.029 in. Pitch  Smiths Interconnect Americas, Inc. Spring Test Probes Inductance 0.9 nH (Self) @ 0.029 in. Pitch   Length, Overall 0.225 In. In.  Smiths Interconnect Americas, Inc. Length, Overall 0.225 In. In.  Spring Test Probes Length, Overall 0.225 In. In.  Smiths Interconnect Americas, Inc. Spring Test Probes Length, Overall 0.225 In. In.   Material, Barrel Nickel/Silver  Smiths Interconnect Americas, Inc. Material, Barrel Nickel/Silver  Spring Test Probes Material, Barrel Nickel/Silver  Smiths Interconnect Americas, Inc. Spring Test Probes Material, Barrel Nickel/Silver   Material, Plating Gold Plated (Plunger)  Smiths Interconnect Americas, Inc. Material, Plating Gold Plated (Plunger)  Spring Test Probes Material, Plating Gold Plated (Plunger)  Smiths Interconnect Americas, Inc. Spring Test Probes Material, Plating Gold Plated (Plunger)   Material, Plunger Beryllium Copper  Smiths Interconnect Americas, Inc. Material, Plunger Beryllium Copper  Spring Test Probes Material, Plunger Beryllium Copper  Smiths Interconnect Americas, Inc. Spring Test Probes Material, Plunger Beryllium Copper   Material, Spring Stainless Steel  Smiths Interconnect Americas, Inc. Material, Spring Stainless Steel  Spring Test Probes Material, Spring Stainless Steel  Smiths Interconnect Americas, Inc. Spring Test Probes Material, Spring Stainless Steel   Minimum Centers 0.026 In.  Smiths Interconnect Americas, Inc. Minimum Centers 0.026 In.  Spring Test Probes Minimum Centers 0.026 In.  Smiths Interconnect Americas, Inc. Spring Test Probes Minimum Centers 0.026 In.   Primary Type Probe  Smiths Interconnect Americas, Inc. Primary Type Probe  Spring Test Probes Primary Type Probe  Smiths Interconnect Americas, Inc. Spring Test Probes Primary Type Probe   Temperature, Operating -55 to +150 °C  Smiths Interconnect Americas, Inc. Temperature, Operating -55 to +150 °C  Spring Test Probes Temperature, Operating -55 to +150 °C  Smiths Interconnect Americas, Inc. Spring Test Probes Temperature, Operating -55 to +150 °C   Tip Style Crown Headless/Spherical  Smiths Interconnect Americas, Inc. Tip Style Crown Headless/Spherical  Spring Test Probes Tip Style Crown Headless/Spherical  Smiths Interconnect Americas, Inc. Spring Test Probes Tip Style Crown Headless/Spherical   Type Semiconductor  Smiths Interconnect Americas, Inc. Type Semiconductor  Spring Test Probes Type Semiconductor  Smiths Interconnect Americas, Inc. Spring Test Probes Type Semiconductor  
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