amphenol代理商
专业销售Amphenol(安费诺)全系列产品-英国2号仓库
库存查询
美国1号分类选型新加坡2号分类选型英国10号分类选型英国2号分类选型日本5号分类选型

在本站结果里搜索:    
热门搜索词:  Connectors  8910DPA43V02  Amphenol  UVZSeries 160VDC  70084122  IM21-14-CDTRI

101294-000 - 

PROBE BAYONET CONN BATTERY CONN (101294-000)

Smiths Interconnect Americas, Inc. 101294-000
声明:图片仅供参考,请以实物为准!
制造商产品编号:
101294-000
仓库库存编号:
70009216
技术数据表:
View 101294-000 Datasheet Datasheet
订购热线: 400-900-3095  0755-21000796, QQ:800152669, Email:sales@szcwdz.com
由于产品数据库庞大,部分产品信息可能未能及时更新,下单前请与销售人员确认好实时在库数量,谢谢合作!

101294-000产品概述

Battery Contact Probes

IDI Battery Contact and/or Interconnect probes are designed to optimize contact performance in high reliability, multiple cycle applications. These probes are very reliable, compact, durable and provide an extremely high cycle life, even in the harshest of environments.

101294-000产品信息

  Brand/Series  101294 Series  
  Centerline, Spacing  0.050 (1.27) In.(mm) In.(mm)  
  Contact Resistance  20 Milliohms (Max.) Milliohms (Max.)  
  Current Rating  5 A A  
  Force, Spring  0.45 Oz. Oz.  
  Gender  Probe  
  Length, Overall  0.228 In. In.  
  Material, Barrel  Nickel/Silver  
  Material, Bias Ball  Stainless Steel  
  Material, Plating  Gold Plated (Plunger)  
  Material, Plunger  Beryllium Copper  
  Material, Spring  Stainless Steel  
  Maximum Travel  0.027 In.  
  Minimum Centers  0.050 In.  
  Primary Type  Probe  
  Tip Style  Spherical Radius  
  Type  Battery Contact  
  Working Travel  0.020  
关键词         

101294-000相关搜索

Brand/Series 101294 Series  Smiths Interconnect Americas, Inc. Brand/Series 101294 Series  Spring Test Probes Brand/Series 101294 Series  Smiths Interconnect Americas, Inc. Spring Test Probes Brand/Series 101294 Series   Centerline, Spacing 0.050 (1.27) In.(mm) In.(mm)  Smiths Interconnect Americas, Inc. Centerline, Spacing 0.050 (1.27) In.(mm) In.(mm)  Spring Test Probes Centerline, Spacing 0.050 (1.27) In.(mm) In.(mm)  Smiths Interconnect Americas, Inc. Spring Test Probes Centerline, Spacing 0.050 (1.27) In.(mm) In.(mm)   Contact Resistance 20 Milliohms (Max.) Milliohms (Max.)  Smiths Interconnect Americas, Inc. Contact Resistance 20 Milliohms (Max.) Milliohms (Max.)  Spring Test Probes Contact Resistance 20 Milliohms (Max.) Milliohms (Max.)  Smiths Interconnect Americas, Inc. Spring Test Probes Contact Resistance 20 Milliohms (Max.) Milliohms (Max.)   Current Rating 5 A A  Smiths Interconnect Americas, Inc. Current Rating 5 A A  Spring Test Probes Current Rating 5 A A  Smiths Interconnect Americas, Inc. Spring Test Probes Current Rating 5 A A   Force, Spring 0.45 Oz. Oz.  Smiths Interconnect Americas, Inc. Force, Spring 0.45 Oz. Oz.  Spring Test Probes Force, Spring 0.45 Oz. Oz.  Smiths Interconnect Americas, Inc. Spring Test Probes Force, Spring 0.45 Oz. Oz.   Gender Probe  Smiths Interconnect Americas, Inc. Gender Probe  Spring Test Probes Gender Probe  Smiths Interconnect Americas, Inc. Spring Test Probes Gender Probe   Length, Overall 0.228 In. In.  Smiths Interconnect Americas, Inc. Length, Overall 0.228 In. In.  Spring Test Probes Length, Overall 0.228 In. In.  Smiths Interconnect Americas, Inc. Spring Test Probes Length, Overall 0.228 In. In.   Material, Barrel Nickel/Silver  Smiths Interconnect Americas, Inc. Material, Barrel Nickel/Silver  Spring Test Probes Material, Barrel Nickel/Silver  Smiths Interconnect Americas, Inc. Spring Test Probes Material, Barrel Nickel/Silver   Material, Bias Ball Stainless Steel  Smiths Interconnect Americas, Inc. Material, Bias Ball Stainless Steel  Spring Test Probes Material, Bias Ball Stainless Steel  Smiths Interconnect Americas, Inc. Spring Test Probes Material, Bias Ball Stainless Steel   Material, Plating Gold Plated (Plunger)  Smiths Interconnect Americas, Inc. Material, Plating Gold Plated (Plunger)  Spring Test Probes Material, Plating Gold Plated (Plunger)  Smiths Interconnect Americas, Inc. Spring Test Probes Material, Plating Gold Plated (Plunger)   Material, Plunger Beryllium Copper  Smiths Interconnect Americas, Inc. Material, Plunger Beryllium Copper  Spring Test Probes Material, Plunger Beryllium Copper  Smiths Interconnect Americas, Inc. Spring Test Probes Material, Plunger Beryllium Copper   Material, Spring Stainless Steel  Smiths Interconnect Americas, Inc. Material, Spring Stainless Steel  Spring Test Probes Material, Spring Stainless Steel  Smiths Interconnect Americas, Inc. Spring Test Probes Material, Spring Stainless Steel   Maximum Travel 0.027 In.  Smiths Interconnect Americas, Inc. Maximum Travel 0.027 In.  Spring Test Probes Maximum Travel 0.027 In.  Smiths Interconnect Americas, Inc. Spring Test Probes Maximum Travel 0.027 In.   Minimum Centers 0.050 In.  Smiths Interconnect Americas, Inc. Minimum Centers 0.050 In.  Spring Test Probes Minimum Centers 0.050 In.  Smiths Interconnect Americas, Inc. Spring Test Probes Minimum Centers 0.050 In.   Primary Type Probe  Smiths Interconnect Americas, Inc. Primary Type Probe  Spring Test Probes Primary Type Probe  Smiths Interconnect Americas, Inc. Spring Test Probes Primary Type Probe   Tip Style Spherical Radius  Smiths Interconnect Americas, Inc. Tip Style Spherical Radius  Spring Test Probes Tip Style Spherical Radius  Smiths Interconnect Americas, Inc. Spring Test Probes Tip Style Spherical Radius   Type Battery Contact  Smiths Interconnect Americas, Inc. Type Battery Contact  Spring Test Probes Type Battery Contact  Smiths Interconnect Americas, Inc. Spring Test Probes Type Battery Contact   Working Travel 0.020  Smiths Interconnect Americas, Inc. Working Travel 0.020  Spring Test Probes Working Travel 0.020  Smiths Interconnect Americas, Inc. Spring Test Probes Working Travel 0.020  
电话:400-900-3095
QQ:800152669
关于我们 | Amphenol简介 | Amphenol产品 | Amphenol产品应用 | Amphenol动态 | 按系列选型 | 按产品规格选型 | Amphenol选型手册 | 付款方式 | 联系我们
Copyright © 2017 www.amphenol-connect.com All Rights Reserved. 技术支持:电子元器件 ICP备案证书号:粤ICP备11103613号